LEIPS: Choose from 3 Types

For high-precision LUMO level measurement and conduction band DOS evaluation!

Low-Energy Back-Scattered Electron Spectroscopy System LEIPS LE-1 Series
Achieves high-precision LUMO level (electron affinity) measurement without damaging organic materials for the first time!
Furthermore, its applications are expanding to inorganic semiconductors, polymer materials, and more.

Configurations tailored to your budget and objectives
Choose from three types based on your budget and specific needs.

Name		IE-1 Complete	IE-1 Basic	IE-1 element
Shape
Configuration		3 rooms (Measurement Room, Buffer Room, Load Lock Room)	2 rooms (Measurement Room, Load Lock Room)	1 room (Measurement Room)
Description		Efficient measurement using a 4-sample stock buffer chamber. Equipped with a vacuum-sealed carrier box.	Simple configuration. Equipped with vacuum-sealed carrier box.	Docks with your individual vacuum system for use.

Configuration

Features
● Measurement energy resolution: 0.5 eV or less
● Equipped with LEIPS software for simple operation (measurement and energy evaluation)
● Stable low-energy electron emission achieved through dedicated electron gun and activation process.
● Zero magnetic field adjustment mechanism at measurement point.
● Substrate holder transport mechanism for easy docking with various systems
● Substrate attachment/detachment possible without atmospheric exposure using the included carrier box.
● Diverse options: High-precision substrate tilt mechanism, deposition mechanism, etc.

Energy Diagram Evaluation

Integrated System Standard Compatibility Energy Diagram Evaluation
We have proven integration experience with photoelectron spectroscopy (XPS, UPS) systems, PYS (photoelectron yield spectroscopy) systems, and others.
● Ionization Energy Ev
● Fermi Level Ef
● Band Gap EG
※ We can propose integrated systems with PYS equipment through collaboration with Tokyo Instruments Co., Ltd.